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詳細(xì)介紹
E8362B 10 MHz至20 GHz
E8363B 10 MHz至40 GHz
E8364B 10 MHz至50 GHz
E8361A：10 MHz至67GHz
- 123 dB的動(dòng)態(tài)范圍和<0.006 dB的跡線噪聲
- <26微秒/點(diǎn)的測(cè)量速度，32個(gè)通道，16,001點(diǎn)
- TRL / LRM校準(zhǔn)，提供晶圓，夾具，波導(dǎo)和天線測(cè)量
- 混頻器轉(zhuǎn)換損耗，回波損耗，隔離和群時(shí)延
- 放大器增益壓縮，諧波，IMD和脈沖射頻
Agilent E8362B E8363B E8364B
Vector Network Analyzer
The Agilent E8362B E8363B E8364B is a member of Agilent s PNA Series network analyzer platform and provides the combination of speed and precision for the demanding needs of today's high frequency, high-performance component test requirements. The PNA Series meets these testing challenges by providing the right combination of fast sweep speeds, wide dynamic range, low trace noise and flexible connectivity. The E8362B E8363B E8364B now provides the capability to more accuray measure mixers and converters with its new frequency-offset capability. Powerful automation and self-help tools make the instrument well suited for both and manufacturing.
Features:
E8362B 10 MHz至20 GHz
E8363B 10 MHz至40 GHz
E8364B 10 MHz至50 GHz
E8361A：10 MHz至67GHz
{cke_protected_1}· {cke_protected_2}0.006 dB of trace noise at 1 kHz IFBW
{cke_protected_3}· {cke_protected_4}26 Microsec/point measurement speed
{cke_protected_5}· {cke_protected_6}32 measurement channels with up to 16,001 points per channel
{cke_protected_7}· {cke_protected_8}Supports TRM/LRM calibration for the most accurate on-wafer, in-fixture, and waveguide measurements
{cke_protected_9}· {cke_protected_10}Optional mixer and amplifier measurement capability
{cke_protected_11}· {cke_protected_12}Optional vector error corrected mixer and converter measurements
{cke_protected_13}· {cke_protected_14}Optional configurable test set
{cke_protected_15}· {cke_protected_16}Optional time domain measurement capability
{cke_protected_17}· {cke_protected_18}Optional frequency extension up to 325 GHz
Options:
{cke_protected_19}· {cke_protected_20}010 - Time Domain
{cke_protected_21}· {cke_protected_22}014 - Configurable Test Set Option （front panel access loops between source output and coupler input）
{cke_protected_23}· {cke_protected_24}016 - Add Receiver Attenuators 35 dB in 5 dB steps
{cke_protected_25}· {cke_protected_26}022 - Extended Memory 512MB
{cke_protected_27}· {cke_protected_28}080 - Frequency- Offset （ for use with mixers, converters and amplifiers）
{cke_protected_29}· {cke_protected_30}081 - Reference Channel Switch （Adds internal switch to R1 Path）
{cke_protected_31}· {cke_protected_32}082 - Scalar calibrated converter measurements
{cke_protected_33}· {cke_protected_34}083 - Frequency Converter Measurement Application S/W
{cke_protected_35}· {cke_protected_36}084 - Embedded LO measurements
{cke_protected_37}· {cke_protected_38}1A7 - ISO 17025 Compliant Calibration
{cke_protected_39}· {cke_protected_40}1CM - Rackmount Kit
{cke_protected_41}· {cke_protected_42}1CP - Rackmount and Handle Kit
{cke_protected_43}· {cke_protected_44}357 - USB to GPIB interface cable
{cke_protected_45}· {cke_protected_46}550 - 4 Port Measurement Application （Enables full 4-port error correction and differential measurements on 2 Port N/A.）
{cke_protected_47}· {cke_protected_48}551 - Adds N-port calibrated measurements
{cke_protected_49}· {cke_protected_50}700 - Standard test set
{cke_protected_51}· {cke_protected_52}720 - Extended Memory 512 MB
{cke_protected_53}· {cke_protected_54}810 - Standard test set and standard power range （700+711）
{cke_protected_55}· {cke_protected_56}811 - Standard test set and extended power range （700-UNL）
{cke_protected_57}· {cke_protected_58}812 - Configurable test set deck and standard power range （014-711
{cke_protected_59}· {cke_protected_60}813 - Configurable test set deck and extended power range （014-UNL）
{cke_protected_61}· {cke_protected_62}816 - Ext pwr range, config testset, rec atten, freq offset, ext ref switch
{cke_protected_63}· {cke_protected_64}830 - Option Bundle Package of UNL, 014,016,080,081,and H11
{cke_protected_65}· {cke_protected_66}831 - Option Bundle Package of UNL, 014,080,081,and H11
{cke_protected_67}· {cke_protected_68}A6J - ANSI Z540 compliant calibration with test data
{cke_protected_69}· {cke_protected_70}AB1 - Korea Quick Users Guide （Korean localization）
{cke_protected_71}· {cke_protected_72}AB2 - China Quick Users Guide （Chinese localization）
{cke_protected_73}· {cke_protected_74}ABA - U.S. Quick Users Guide （English localization）
{cke_protected_75}· {cke_protected_76}ABD - Germany Quick Users Guide （German localization）
{cke_protected_77}· {cke_protected_78}ABE - Spain Quick Users Guide （Spanish localization）
{cke_protected_79}· {cke_protected_80}ABF - France Quick Users Guide （French localization）
{cke_protected_81}· {cke_protected_82}ABJ - Japan Quick Users Guide （Japanese localization）
{cke_protected_83}· {cke_protected_84}ABZ - Italy Quick Users Guide （Italian localization）
{cke_protected_85}· {cke_protected_86}H08 - Pulsed-RF measurement capability
{cke_protected_87}· {cke_protected_88}H11 - IF Access （for antenna,point in pulse,pulse profile and broadband MM wave measurements.）
{cke_protected_89}· {cke_protected_90}H85 - High Power Option w/o Bias Tees. （allows RF Amplifiers between RF Source and Coupler Input）
{cke_protected_91}· {cke_protected_92}UK6 - Commercial calibration with test results data
{cke_protected_93}· {cke_protected_94}UNL - High Power Measurement w/ Bias tees Configuration （Allows Ext. Amplifiers between RF Source and Coupler Input）
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